The EM-Tec range of SEM sample holders comprises a wide variety of holders to make it easier and quicker to mount your samples directly in the SEM. Samples are held by clamping between jaws or secured with screws. When samples are secured correctly, the sample won't move which increases spatial resolution both for imaging and analysis. With the EM-Tec SEM sample holders there are no out-gassing or contamination issues. All EM-Tec SEM sample holders with a M4 threaded hole are fully compatible with the EM-Tec SEM stage adapters.
The wide choice of EM-Tec SEM sample holders include:
Small stub based sample holders – Pin stub based – JEOL stub based – Hitachi stub based |
Pre-tilt sample holders: – Fixed tilt angle – Variable tilt angles |
Metalllographic mount holders |
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SampleClip holders: – Standard pin stub – Zeiss pin stub – JEOL stubs – Hitachi stubs |
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Multi stub holders for: |
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TEM grid holder | Reference sample holders | ||
| FIB grid sample holders |